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Jovan Brankov

职称:Associate Professor

所属学校:Illinois Institute of Technology

所属院系:Electrical and Electronics Engineering

所属专业:Electrical and Electronics Engineering

联系方式:312.567.8819

简介

Ph.D., Illinois Institute of Technology, 2002 M.Sc., Electrical Engineering, Illinois Institute of Technology, 1999 Dipl. Ing., Electrical Engineering, University of Belgrade, 1996

职业经历

Dr. Brankov joined Electrical and Computer Engineering Department at the Illinois Institute of Technology in 2002 as a researcher, in 2004 he was promoted to Research Assistant Professor and in 2008 appointed as Assistant Professor. His research interest includes medical imaging, image sequence processing, pattern recognition and data mining. Emphasis on reconstruction, restoration, analysis (e.g. motion tracking, segmentation, tumor detection), recognition and images acquisition, especially for biomedical applications. His current research topics include: medical image quality assessment based on a human-observer model, multiple-image radiography (a new phase-sensitive x-ray imaging method), 4D and 5D tomographic image reconstruction methods for medical image sequences and high-performance computing using Graphics Processing Unit (GPU). He established the Advance X-ray Imaging Laboratory (AXIL) at IIT, which is currently developing a phase-sensitive x-ray device. He is author/co-author of 100 publications, 2 technical reports and a book chapter. His is currently serving as: associate editor for Medical Physics (AAPM) and Journal of Electronic Imaging (SPIE and IS&T), program committee member for IEEE International Symposium on Biomedical Imaging and SPIE Image Perception conferences and associate member of BioImaging and Signal Processing (BISP) Technical Committee of the IEEE Signal Processing Society. He is a member of SPIE, Sigma Xi and senior member of IEEE technical communities.

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