简介

Dr. Xinran Zhang received both his Ph. D. (2006) and B. S. (2000) in Chemistry from Peking University, China. His thesis research focused on the design and synthesis of solution-processible organic semiconducting materials for environmentally friendly organic xerographic photoreceptors. Prior to joining the faculty at Georgetown University in 2013, he was a guest researcher in the Materials Science and Engineering Division (formerly known as Polymers Division) at National Institute of Standards and Technology (NIST). His work at NIST dealt with the development of microscopic and spectroscopic characterization methods to reveal the structure-property relationship of organic semiconducting thin films for organic field-effect transistors (OFET) and organic photovoltaics (OPV). He is currently serving as the Assistant Director of the Institute for Soft Matter Synthesis and Metrology, or I(SM)2, and responsible for the technical and scientific operation of the instrumentation associated with I(SM)2.