简介

Professor Li-C. Wang received Ph.D. in 1996 from University of Texas at Austin. He was a senior CAD software technical staff member at PowerPC Design Center, Motorola from 1996 to 2000, where he led various projects for PowerPC microprocessor test and verification. Dr. Wang received best paper awards from DATE-1998, IEEE VTS-1999, DATE-2003, VLSI DAT 2008 and 2011. He received the Technical Excellence Award from Semiconductor Research Cooperation (SRC) in 2010 for contribution on developing data mining technologies in the areas of test and validation (https://www.src.org/award/tech-excellence/2010/). He co-founded the IEEE Microprocessor Test and Verification (MTV) Workshop, and is currently the program co-chair. He is currently serving or had served as technical PC member for various IEEE international workshops and conferences including ITC, VTS, ICCAD, DATE, DAC, ISQED, HLDVT, ITSW, DATA, ATS, ICCD, VLSI-DAT, etc and is the general co-chair for VLSI-DAT in 2014 and 2015. He is an associate editor of IEEE Transactions on CAD and also guest editors of a number of IEEE D&T magazine issues, JETTA, journal and ACM TODAES special issues. From 2005, his research group has published more than 70 papers on the topics related to data mining and machine learning in integrated circuit testing, verification and validation. In 2014 and 2015, he had given six tutorials on data mining and had been invited to lecture on data mining related topics in several IEEE conferences, including DAC, ICCAD, ASP-DAC and ISPD.